Point Analysis Controls

Overview

Point Analysis Controls provide configuration options and selection tools for customizing your point-level analysis. This panel lets you specify how similarity is measured, which items to include, and which target or projection to use.

Purpose

• Select which items (e.g., notes, documents) are included in the analysis.
• Configure analysis parameters, such as analysis type and similarity metric.
• Set the target field or projection for the analysis matrix.
• Quickly toggle inclusion of items using checkboxes for granular control.

Key Features

• Analysis Type Dropdown: Choose analysis method (e.g., Embedding Matrix).
• Similarity Metric Selection: Set the metric (e.g., Cosine Similarity).
• Target Field Selector: Specify which projection or feature is analyzed.
• Item Checklist: Select or deselect specific points/items for inclusion.

Tips

• Use checkboxes to focus the analysis on relevant notes or points.
• Adjust the analysis type or similarity metric to explore different relationships.
• Refine selections before generating or updating the matrix in the view.